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by fps-hero 18 days ago
This was a genuinely thought provoking article. I had to challenge some personal assumptions.

Coming from an electrical engineering background, I disagree with how the author presented "Two types of quantizers". Mathematically rigorous, but not grounded in practical systems.

In ADCs, there is always an inherent +-1/2 LSB of quantisation uncertainty. The transfer characteristic is always mid-tread sampling, or at least I haven't come across any counter examples. This is true for bipolar or unipolar ADCs.

The lowest code is negative voltage reference, and the highest code the positive reference. The transfer characteristic plot will show what the author has demonstrated, that the highest and lowest bins will effectively be 1/2LSB in width.

In a unipolar system, this has the consequence of not being able to represent the midpoint voltage precisely, or in other words, the gray problem. In a bipolar system, 0V will be mid-tread N/2 value, but that doesn't mean it has "256 ranges".

So, I'll be sticking with (VREF+ - VREV-) * k / (2^N - 1). Or in other words I agree with the normalisation by 255. It's the fence post error all over again, you have N values, but N-1 ranges. If you have less ranges than you do values, you need to distribute 1 of those ranges between two values, hence the 1/2LSB range endpoints.

2 comments

All ADCs I have looked at document that they can't represent the positive full scale. For instance, for an 8 bit ±1 V ADC, -128 represents -1 V, +127 represents 127/128=0.99219 V. The transition from 126 to 127 happens at 1.5 LSB from the positive full range. 1 LSB difference represents 1/128 = 0.00781 V difference, and not 2 / 255 = 0.00784 V.

But if you actually care about what the voltage (and uncertainty) is, most of this is difference is mostly pointless, you're reference will have a bias, there are linearity errors and so on. 1 LSB will not match either the 1/128 or 2/255, you will need parameters to compensate for it.

You've made me do even more digging and now I'm even more confused.

ATMega328P, data sheet specifically calls out using that it cannot represent full range, ADC = VIN * 1024 / VREF. The STM32F4 datasheet shows an idealised transfer function which is mid-tread, but the "actual transfer function" is sort of a shifted mid-tread (lowest code is larger than a single LSB, highest code is VREF and 1/4 LSB). Other STM32 references I found show that it should follow an ideal mid-tread, unless you are using VADC as your voltage reference. High resolution differential input ADCs are, as best as I can tell, always mid-tread with both end codes representing the positive and negative voltage reference.

The best data sheet I've found was for a PIC32, very detailed transfer characteristic diagram. This shows that each LSB is VREF/1024, but also why! The transfer function shows that is is still a mid-tread transfer, but the highest code is assigned to (1023/1024) * VREF, hence the divide by 1024, but it doesn't solve the 1/2LSB end bin problem.

This is different to the ideas presented the article, there is no reason a single ended ADC couldn't use mid-tread quantisation with VREF as the end code. What it does show is that by using divide by 256, you are truncating the range and arbitrarily deciding where the end points should be. This doesn't fix any inherent 1/2LSB quantisation uncertainty, which was the main argument against using divide by 255.

As you say, in ADCs it's a moot point with all of the other sources of error.

Largely those datasheets are poorly written... but in practice it doesn't matter much because the manufacturing variations of offset and gain error are larger than the quantization level.
The datasheet specifications are largely standardized across ADC manufacturers and do not represent the exact mathematical norm but rather the range of ADC performances. So it's not that "the transfer characteristic is always mid-tread sampling" but rather that "the ideal model of the transfer characteristic is always X".

I do have some historical examples where mid-riser was used, but in practice it doesn't matter when you consider ADC variations and the variation of gain and offset are multiple counts. (8-bit or more; this exact definition would have been important for ADCs less than 8 bits.)