|
|
|
|
|
by ajb
525 days ago
|
|
So they massively reduce the area lost to defects per wafer, from 361 to 2.2 square mm. But from the figures in this blog, this is massively outweighed by the fact that they only get 46222 sq mm useable area out of the wafer, as opposed to 56247 that the H100 gets - because they are using a single square die instead of filling the circular wafer with smaller square dies, they lose 10,025 sq mm! Not sure how that's a win. Unless the rest of the wafer is useable for some other customer? |
|
If their routing around the defects is automated enough (given the highly regular structure), it may be a massive economy of efforts on testing and packaging the chip.