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by ithkuil
1088 days ago
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But the comparison is not fair. Yes the electron microscope can image a lot of details "in parallel" but not all details from all angles, all internal microfractures. You can't easily measure all temperature gradients in all cubic nanometers of the material etc etc. The simulation is slow because it works at that level and thus as a side effect will also give you that output. Obviously if you don't need all that information you may find another route to arrive at the results you want |
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