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by throwawaylinux
1497 days ago
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It's not emerging, electromigration been a core constraint in semiconductor design for 60 odd years. E.g.,: Blech, I. A. and Sello, H. (1966). The Failure of Thin Alluminum Current-Carrying Strips on Oxidized Silicon. In Proc. Symposium on PoF in Electronics, 496-505. |
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