The device level images are a mix of Scanning Electron Microscope (SEM) and visual microscope images.
A bunch of different ways. Depends on the material being measured but measuring sheet resistance (effectively, you can back calculate the thickness by measuring the resistance of a square of known size) and light scattering off the surface are the most common.
A bunch of different ways. Depends on the material being measured but measuring sheet resistance (effectively, you can back calculate the thickness by measuring the resistance of a square of known size) and light scattering off the surface are the most common.