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by nickpsecurity
3439 days ago
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They don't. Too many attack vectors. I illustrate here: https://news.ycombinator.com/item?id=10468624 My solution was to print the TCB on a process node that was verifiable by eye. Then, verify a random sample of each batch. Possibly speed it up with image processing algorithms if producing the same component or components. Note: Deviations from intended circuitry in deep sub-micron can have measurable differences at analog or RF level. DARPA is funding research to do such things. A monitor at visible node could then be combined with CPU's on cutting-edge node. Common practice in commercial sector is obfuscations, though. |
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